USPM-RU III lens reflectance tester
The USPM-RU III reflectometer can accurately measure the spectral reflectance of small and thin samples that cannot be measured by current spectrometers, and will not interfere with the reflected light on the back of the sample. It is a very suitable reflectivity measurement system for measuring the reflectance of curved surfaces, evaluation of coatings, and small parts.
1. Eliminate back reflection light
A special optical system is used to eliminate the back reflection light.
It is not necessary to perform anti-reflection treatment on the back surface, and the reflectance of the surface can be accurately measured.
2. Can measure the reflectance of small areas
Using the objective lens to focus on the tiny spot (ø60 μm) on the sample surface, you can determine whether the lens curved surface and the coating layer are uniform.
3. Short measurement time
Thanks to the high-speed spectrophotometering mechanism using Flat Field Grating (flat grating) and line sensor, fast and highly reproducible measurement can be performed.
4. Support XY chromaticity diagram, L*a*b* measurement
The color of an object can be determined by spectroscopic reflectance according to the spectrophotometric method.
5. The film thickness of high-strength coatings can be measured
Using interference light spectroscopy, the film thickness of the test object (single layer film) can be measured without contact or damage.
Lens reflectance tester USPM-RU III: Specifications
Measuring wavelength | 380 nm～780 nm |
test methods | Comparative determination with reference sample |
Object N.A. | 0.12 (when using 10× objective lens) 0.24 (when using 20× objective lens) * Different from the N.A. of the objective lens. |
Object W.D. | 10.1 mm (when using 10× objective lens) 3.1 mm (when using 20× objective lens) |
The radius of curvature of the object to be inspected | -1R ～-∞、+1R～∞ |
The measurement range of the object to be inspected | About ø60 μm (when using a 10× objective lens) About ø30 μm (when using a 10× objective lens) |
Measurement reproducibility（2σ） | ±0.1% (when measuring from 380 nm to 410 nm) ±0.01% (when measuring from 410 nm to 700 nm) |
Display resolution | 1 nm |
Measuring time | Several seconds to ten seconds (varies depending on the sampling time) |
Light source specifications | Halogen lamp 12 V 100 W |
Z direction drive range of the stage | 85mm |
PC interface | USBWay |
Device weight | Body: about 20 kg (except PC and printer) Power supply for light source: about 3 kg Controller box: about 8 kg |
Device size | body: 300（W）×550（D）×570（H） mm 150（W）×250（D）×140（H） mm 220（W）×250（D）×140（H） mm |
Power Specifications | Power supply for light source： |
Use environment | Horizontal and vibration-free place Temperature: 23±5 °C Humidity: 60% or less, no condensation |
* This device does not guarantee absolute accuracy in the traceability system.
* Can be specially made to measure the wavelength of 440 nm ~ 840 nm specifications.
